Introduction:

The new OlympIOs Yield module gives the user the ability to calculate the variation in device performance, given some known process variations. It is possible to define specifications for each performance parameter, so a yield percentage can be calculated.

The new module enables the user to predict and improve device yield in an efficient and user-friendly way.

The yield module consists of two parts: A Design Of Experiment (DOE) routine that performs a minimal amount/minimum number of simulations to fit an analytical model of the simulated device, and a Monte Carlo simulation that creates performance parameter distributions using the fitted model.

The yield module is available for both floating licenses as well as node-locked (dongle/keylock protected) licenses. As base modules, it requires, at minimum, the script module and at least one simulation module.

Input parameters:

The yield settings dialog below gives an indication how the relevant input and simulation parameters can be specified.

In this dialog, the user can specify which input variables are used and what the mean and standard deviations are. Note that the current version assumes all input distributions are Gaussian.
When the Yield settings dialog contains all the information, the yield calculation can be started by selecting Start Yield in the Yield menu, or by using the script command sim::yield();

Output parameters:

After the yield calculation the result processing will look like this.

When more than one result variable is included in the yield calculation (spec. minimum and maximum are not both 0), a yield percentage is calculated for each individual result variable. A total yield percentage is also calculated.